UltraDry EDS Detector – Silicon Drift X-Ray Detector
The Thermo UltraDry EDS detector is a new generation energy dispersive silicon drift X-ray detector that combines superior resolution and incredibly high count rates resulting in rapid analysis with excellent accuracy. Furthermore the smallest-in-class The high performance of this detector is enhanced by the integration of an advanced field-effect transistor (FET) and a proprietary preamplifier stage. The FET has been miniaturised and integrated into the crystal structure which effectively eliminates device capacitance and hence electronic noise.
The UltraDry detector is part of a highly engineered, fully integrated X-ray microanalysis system. Advanced oulse processing technology in conjunction with unique algorithms address zero peak artefacts, resulting in the ability to accurately measure light elements down to beryllium.
Unique Collimator Design
Thermo Scientifics unique slotted collimator design produces consistent data collection rates across the widest range of working distances. This is key when simultaneously collecting EDS and EBSD spectra.
Crystal Sizes
These detectors come in a range of crystal active areas (10, 30, 60 and 100mm2). Furthermore, the smallest in class packaging envelope provides the greatest solid angle of detection for any commercially available detector
Similar Products
Related Products
Specifications
| Integrated Operation | EDS, WDS, and EBSD operation and analysis in a fully unified software platform. |
| Operating Environment | 35°C |
| Options | Motorised slide |
| Peak Shift | ±5eV peak shift (±3eV typical between 1% and 60% deadtime) from minimum to maximum count rate at a given analyser time constant. |
| Phase Mapping | The NORAN System 7 allows you to identify phases during the acquisition. |
| Resolution | ±5 eV resolution change (±3eV typical between 1% and 60%dead time) from minimum to maximum count rate at a given analyser time constant. |
| STD Distance | 50mm |
| Active Area | up to 100mm |
| Third Party Communication | Can be integration with third party applications. |
| Analysis Automation | Acquires a spectrum at every point—useful for imaging, X-ray mapping, Linescan and advanced automated analysis. |
| TOA | 35° |
| FWHM Measured | 5.89 keV (Mn-Ka) with 10,000 counts per second. |
| Input Counts | >1,000,000 |
| Chemical Typing | Chemical Typing software classifies particles by matching their quantitative chemical composition to a database. |
| Feature Sizing | Feature Sizing software collects the morphological and chemical characteristics of infrequently occurring particles in large area samples. |